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1 THE JOURNAL OF KOREAN INSTITUTE OF ELECTROMAGNETIC ENGINEERING AND SCIENCE Aug.; 24(8), ISSN (Print) ISSN X (Online) HEMP (PCI) Analysis of PCI Cable Effects in HEMP Conducted Disturbance 장태헌 Tae-Heon Jang 요약 (HEMP). IEC HEMP. IEC HEMP. IEC IEC :1997,. HEMP 50 MHz,,. HEMP, PCI. Abstract The high-altitude electromagnetic pulse(hemp) conducted environment and the HEMP radiated environment are established as the consequences of a high-altitude nuclear explosion. The IEC , the international standard, defines the HEMP conducted environment. The IEC defines how protective devices for conducted disturbance proposed for HEMP protection shall be specified. The IEC deals with methods for testing protective devices for HEMP conducted disturbance. The IEC :1997 mainly describes the measurement method of small protective components. However, it does not provide the measurement method for a combination filter of a protective component and a filter which is widely used in recent. It is important to consider the characteristic of the measurement setup parameters like thickness and length of the cable and its height above ground plane etc. in establishing measurement setup because HEMP conducted disturbances include the frequency spectrum below 50 MHz. This paper deals with the optimized measurement method, considering the frequency spectrum of HEMP conducted disturbance, current waveform, and analyzing the effects of cables existing in the measurement setup. Key words : HEMP, Filter, Pulse Current Injection(PCI), Cable, Measurement Method. 서론 (HEMP). HEMP "HEMP ". (EM Technology Center, Korea Testing Laboratory) Manuscript received June 14, 2013 ; Revised August 14, 2013 ; Accepted August 16, (ID No S) Corresponding Author : Tae-Heon Jang ( thjang@ktl.re.kr) 772 c Copyright The Korean Institute of Electromagnetic Engineering and Science. All Rights Reserved.

2 HEMP (PCI) 그림 2. Fig. 2. Double exponential waveform. 그림 1. HEMP Fig. 1. International standardization for HEMP protection. 1. IEC HEMP. IEC HEMP. IEC [1] [3]. HEMP (GDT), (Spark Gap), (MOV),,,, RF. IEC :1997 Ed.1.0 GDT MOV,. HEMP (early-time) HEMP (E 1 ) (Intermediate-time) HEMP (E 2 ), (Late-time) HEMP (E 3 ). 2. HEMP, Mil-Std HEMP 1 [4]. E 1, 50 MHz 표 1. Mil-Std HEMP Table 1. Definition of conducted HEMP waveform in Mil-Std E 1 E 2 E 3 20 ns 1 us 0.2 s ns 3 5 ms s 2,500 A 250 A 1,000 A,,. HEMP, PCI.. E 1 펄스주입케이블영향분석 2-1 HEMP 전도성방해신호의분석 HEMP. HEMP (1) [4]. (1) (A), (s), (Full Width Half Maximum, FWHM). (Pulse Current Injection, PCI) 10 ns, 500 ns E 1 3(a) 773

3 THE JOURNAL OF KOREAN INSTITUTE OF ELECTROMAGNETIC ENGINEERING AND SCIENCE. vol. 24, no. 8, Aug (a) E 1 (a) Current waveform of E 1 pulse 그림 4. Fig. 4. Setup for verification of the test pulse level. (b) E 1 (b) Frequency spectrum of E 1 pulse 그림 5. Fig. 5. Equivalent circuit for verification setup of the test pulse level. 그림 3. E 1 Fig. 3. Waveform and frequency spectrum of E 1., 3(b). 3(b) E 1 50 MHz. 2-2 E1 펄스주입케이블의파라미터분석 HEMP 4,. IEC Ed.1.0 (PT ). 4 L 1 HEMP. 10 ns E 1 L 1 그림 6. ( ) [6] Fig. 6. Single cable over ground plane(losses neglected) [6].. L 1 5 6, L 1,. 4 E 1 R g =60 Ω, 5 Z L =0. (2). 774

4 HEMP (PCI) tan (2) 6 (3) [5]. cosh (3) r, h. (r h) (2) (4). ln (4) (3),. r h. 5 RL, RL =L/R.,. 그림 7. EMEC PCI Fig. 7. Verification setup for PCI test level in EMEC... PCI (L 1 ). 3-2 케이블길이 (L 1 ) 변화에따른영향분석, : 9 mm 2 4 mm m, 0.4 m, 0.8 m, 1.6 m, 2.0 m. L 1 50 mm. E 1,,, PCI.. EM Topology Tool 을이용한시뮬레이션 3-1 EMEC 에서의 PCI 시험셋업구현 PCI EM, EMEC 7. PCI PCI. HEMP E 1 E 2. (L 1 ) 그림 8. 9 mm 2 Fig. 8. Variation of current amplitude depending on cable length of the cross section area 9 mm

5 THE JOURNAL OF KOREAN INSTITUTE OF ELECTROMAGNETIC ENGINEERING AND SCIENCE. vol. 24, no. 8, Aug 표 2. L 1 Table 2. Simulation results for the waveform of shortcircuit current with the lengths of cable L 1. L 1 (9 mm 2 ) L 1 (m) (A) (ns) (ns) L 1 (4 mm 2 ) 그림 mm 2 Fig. 10. Variation of FWHM depending on cable length of the cross section area 9 mm m, 1.6 m Mil-Std m 2.0 m.. 그림 mm 2 Fig. 11. Variation of current amplitude depending on cable length of the cross section area 4 mm 접지면위케이블높이에따른영향분석 6 h 그림 9. 9 mm 2 Fig. 9. Variation of pulse rise time depending on cable length of the cross section area 9 mm 2. 그림 mm 2 Fig. 12. Variation of pulse rise time depending on cable length of the cross section area 4 mm 2. 3 mm 5, 10, 20, 30, 40, 50, 100 mm. 776

6 HEMP (PCI) 그림 mm 2 Fig. 13. Variation of FWHM depending on cable length of the cross section area 4 mm 2. 표 3. L 1 Table 3. Variation of the waveform of short-circuit current with variation of the lengths of L 1 in simulation. (mm 2 ) L 1 (m) (%) (%) (%) 표 4. L 1 Table 4. Simulation results for the waveform of short-circuit current with the heights of L 1. L 1 (9 mm 2 ), (1 m) h(mm) (A) (ns) (ns) L 1 9 mm 2, 1 m mm 100 mm 6 % 그림 14. Fig. 14. Height effects of cable over the ground plane., 138 %, 21.5 %.. PCI 측정셋업에서의단락전류파형측정결과 4 PCI, 15 E 1 [7] PCI., Mil-Std m 2.0 m. 그림 15. E 1 Fig. 15. Measurement setup for test level of E 1 pulse generator. 777

7 THE JOURNAL OF KOREAN INSTITUTE OF ELECTROMAGNETIC ENGINEERING AND SCIENCE. vol. 24, no. 8, Aug 표 5. L 1 Table 5. Measurement results for the waveform of short-circuit current with the lengths of L 1. L 1 (9 mm 2 ) L 1 (m) (A) (ns) (ns) L 1 (4 mm 2 ) 0.2 1, , 그림 mm 2 Fig. 17. Rise time measurement results with 9 mm 2 cables. 그림 mm 2 FWHM Fig. 18. FWHM measurement results with 9 mm 2 cables. 그림 mm 2 (1,000 A +/ 4 %) Fig. 16. Peak current measurement results with 9 mm 2 cables(1,000 A +/ 4 %). 그림 mm 2 (1,000 A +/ 4 %) Fig. 19. Peak current measurement results with 4 mm 2 cables(1,000 A +/ 4 %). 그림 mm 2 Fig. 20. Rise time measurement results with 4 mm 2 cables. 778

8 HEMP (PCI) 0.5 m.. References 그림 mm 2 FWHM Fig. 21. FWHM measurement results with 4 mm 2 cables. 표 6. L 1 Table 6. Variation of the waveform of short-circuit current with variation of the lengths of L 1 in measurement results. (mm 2 ) L 1 (m) (%) (%) (%) 결론 HEMP PCI. HEMP E 1 ns,,,. [1] IEC , Electromagnetic compatibility(emc)- Part 2-10: Environment-Description of HEMP environment-conducted disturbance, [2] IEC , Electromagnetic compatibility(emc)- Part 5: Installation and mitigation guidelines-section 5: Specification of protective devices for HEMP conducted disturbance, [3] IEC , Electromagnetic compatibility(emc)- Part 4: Testing and measurement techniques-section 24: Test methods for protective devices for HEMP conducted disturbance, [4] Mil-Std , "High-Altitude Electromagnetic Pulse(HEMP) protection for ground-based c4i facilities performing critical, time-urgent missions, Part I - fixed facilities", [5] Clayton A. Paul, Introduction to Electromagnetic Compatibility(second edition), A John Wiley & Sons, Inc., pp , [6] K. S. H. Lee, EMP Interaction: Principles, TechNiques, and Reference Data, Hemisphere Publishing Corporation, pp , [7],,, "HEMP ", 2012,,

9 THE JOURNAL OF KOREAN INSTITUTE OF ELECTROMAGNETIC ENGINEERING AND SCIENCE. vol. 24, no. 8, Aug : ( ) : () : / : [ 주관심분야 ] EMC, EMP, 780

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