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1 ISO Report 2. ISO Scope 3. Summary of Standard meeting 1. Detail result of Standard meeting 2. ISO Doc. Summary ~16

2 1/7

3 2. ISO Scope Scope of Standardization for Displays Scope of International Standards in FPD Industry Equipment Parts Material Panel Maker Market & User Set Maker SEMI FPD (31 Documents) VESA FPDM Ver.2 (Published), SPWG & PSWG IEC ,-6 (CDV) IEC (Published) ISO 9241,13406 (FDIS), 18789, TCO 03 2/7

4 2. ISO Scope TC159/SC4/WG2 SC4 : Ergonomic of Human system-interaction Visual Display Requirement (TC159/SC4/WG2) Convenor : Prof. Dr. F.L. van Nes Eindhovan University of Technology As of May 28, 03 Secreatry : Ms. Karin Winklemann / DIN German Finland Netherlands Europe USA Japan Korea 1.Appeal, IBM 2.Michalla, HVBG, 3.Schueer, TUV 4.Neumeier, Autronic 5.Becker, Systeme 1.Lindfords, Nokia 2.Hakkinen, Nokia 3.Levola, Nokia 1.Sluyterman, LPD 1.Luet, France 2.Schanda, Hungary 3.Sceenkman,Sweden 4.Pedersen, Denmark 5.Travisl, UK 1.Albin,Auburn Eng g 2.Boynton, NIST 3.Kelly, NIST, 4.Granda, Consultant 5.Leise, IBM 6.Meyer, AFRL 1.Kakano, OKI 2.Yoshitake, IBM 3.Umezu, Toshiba 4.Fukuzumi, NEC 1.Il-Ho Kim, LG.Philips LCD 3/7

5 2. ISO Scope ISO Structure - 기존의 ISO ,7,8 및 ISO 를대체하기위해 2003 년 11 월 15 일까지 Committee Draft 를작성예정 ISO : Ergonomic requirements and measurement techniques for electronic visual displays -- Part 1 : Introduction and overview - Floris van Nes -- Part 2 : Terms and definitions - Ed Kelley (via Paul Boynton) -- Part 3 : Ergonomics requirements - Floris van Nes -- Part 4 : Usability laboratory test methods (Co-Editor; how to proceed without one) -- Part 5 : Optical laboratory test methods - Paul Boynton -- Part 6 : Workplace test methods - Verner Pedersen -- Part 7 : Analysis and compliance test methods - Stephan Scheuer 4/7

6 3. Summary of Standard meeting 1. 일시및장소 : ~ 10/28, IBM meeting room of Berlin 2. 참석자 : 총 20 명 ( 일본 member 3 명은불참했으며, LCD Maker 는한국만참석함 ) - Convenor : Prof. Van Nes - Secretary : Ms. KarinWinkelmannof DIN, Mr Stefan Kredbs of DIN - Members & Observer : 1) German : Appeal, Alfred Malina of IBM, Georg Michalla of HVBG, Stephan Scheuer of TUV, Neumeier 외 1 명 2) USA : Ian Miller of Samsung America, Paul A. Boynton of NIST, Richard E.Granda of IBM 3) UK : David Trabis of USERFOCUS 4) Netherlands : Sluyterman of LG.Philips Displays 5) Finland : Max Lindfors of Nokia 6) Denmark : Verner Pedersen of 7) Korea : Il-Ho Kim, Don-Gyou Lee of LG.Philips LCD, Jonseo Lee, Gi-chang Park of Samsung, 3. 협의내용 : ISO ) ISO ) 11 월 15 일까지최종 CD 초안이완료될예정이며, 이에따른최종 comment 및문서수정사항에대한논의가실시됨. 3) 구체적으로각 part 별로문서수정및 comment input 작업이실시됨. 4) 한국의 Pixel fault proposal 에대한발표 ( 김일호차장 ) 및한국제시안에대한논의 5) 한국 member 들의 member 등록을위한공식 Korea Standard Institute 의 letter 요청이있었음. 4. 향후일정 : 1) 한국에서제시한 pixel fault 안이인정될수있는 back data 의송부 2) 11 월 15 일이전에 ISO CD 수정사항을각 part leader 에게송부예정 3) 한국참여 member 들의공식적인 member 가입이될수있도록산업자원부의지원이요구됨. 4) 차기회의는 2004 년 4 월 28~30 에비엔나에서개최될예정임. 5/7

7 3. Summary of Standard meeting 6/7

8 3. Summary of Standard meeting 7/7

9 1. Detail result of Standard meeting Part 7: Analysis & compliance test methods Pixel Fault Table. Definition of Pixel Fault 1/10

10 1. Detail result of Standard meeting Part 7: Analysis & compliance test methods Pixel Fault Figure. Definition of Pixel Fault 2/10

11 1. Detail result of Standard meeting Part 7: Analysis & compliance test methods Pixel Fault Table. Comparison between old and new Class of Pixel fault Pixel failures per mio. pixels Current status of ISO : LG.Philips LCD, Kumi Research Lab. Product Development Planning & Administration Please, contact to Il-Ho Kim( ) New status of ISO : Class Type 1 Type 2 Type 3 allways bright pixel allways dark pixel defective subpixel or blinking Class Type 1 Type 2 Type 3 allways bright pixel allways dark pixel defective subpixel or blinking Cluster of Type 1 or 2 Cluster of Type 1 or 2 Cluster of Type 3 Cluster of Type MNV Proposal New Old 2, new Old 3, new Old 4, new /10

12 1. Detail result of Standard meeting Part 7: Analysis & compliance test methods Pixel Fault Table. Korea committee proposal for new pixel fault Pixel failures per mio. pixels Current status of ISO : Number of Pixels Defects per 1M Pixels Class Type 1 Type 2 Type 3 allways bright pixel allways dark pixel defective subpixel or blinking New status of ISO Class Type 1 Type 2 Type 3 Cluster of Type 1 or Cluster of Type 1 or allways bright allways dark subpixel or Cluster of Type 3 2 pixel pixel blinking NMV New Korea Committee Proposal Korea New Old 2, new Old 3, new Old 4, new Cluster of Type 3 4/10

13 1. Detail result of Standard meeting Part 7: Analysis & compliance test methods Pixel Fault Table. Korea committee proposal of new Class of Pixel fault based on Display Format Pixel failures per whole panel Resolutions: Pixels Mio. Pixels XGA resolution SXGA resolution SXGA+ resolution UXGA resolution For XGA: Class Type 1 Type 2 Type 3 allways bright pixel allways dark pixel defective subpixel or blinking Cluster of Type 1 or Cluster of Type NMV New Korea New Old 2, new Old 3, new Old 4, new For SXGA: Class Type 1 Type 2 Type 3 allways bright allways dark defective subpixel or pixel pixel blinking SXGA NMV New SXGA Korea New SXGA+ NMV New SXGA+ Korea New Old 2, new Old 3, new Old 4, new For UXGA: Class Type 1 Type 2 Type 3 allways bright allways dark defective subpixel or Cluster of Type 1 or Cluster of Type 3 2 Cluster of Type 1 or Cluster of Type 3 2 pixel pixel blinking NMV New Korea New Old 2, new Old 3, new Old 4, new /10

14 1. Detail result of Standard meeting Part 5: Optical laboratory test method Part 5 Optical test method, test. (1) Korean character test pattern Optical test pattern,. test pattern. Korea character set New Korea proposed character set 6/10

15 1. Detail result of Standard meeting Part 5: Optical laboratory test method (2) Contrast under Ambient illumination (3) Luminance directional uniformity (4) Contrast directional uniformity (5) Directional Gamma and the uniformity 7/10

16 1. Detail result of Standard meeting Part 5: Optical laboratory test method (6) 8/10

17 1. Detail result of Standard meeting Part 5: Optical laboratory test method (7) 9/10

18 1. Detail result of Standard meeting Part 5: Optical laboratory test method (8) Directional Color Uniformity (9) Lateral Luminance uniformity ( ) (10) Gray inversion test method. 10/10

19 2. ISO Doc. Summary Part 3 : Ergonomic requirements - Berlin CD. 6.1 Viewing conditions Design viewing distance Design viewing direction Gaze and head tilt angles Viewing direction Screen/Pixel faults 6.2 Luminance Illuminance Display luminance Luminance coding Pixel density Luminance balance 6.3 Special physical environments Vibration Wind and rain Excessive temperatures 6.4 Luminance and colour uniformity Luminance uniformity Colour non uniformity Contrast non uniformity Geometric distortions Screen/Pixel faults Temporal instability or 'flicker' Spatial instability or 'jitter' Crosstalk Moire effects Swim Unwanted reflectin Unitended images 6.5 Legibility and readability Luminance contrast Image polarity Character height Character size uniformity Character stroke width Character width-to-height ratio Character format Between-character spacing Between-word spacing Between-line spacing 6.6 Legibility of information coding Luminance coding Absolute luminance coding Blink coding Color coding Geometrical coding 6.7 Legibility of graphics Monochrome and multicolour object size Contrast for object legibility Color consideration for graphics Background and surrounding image effects Number of colors 6.8 Fidelity Colour gamut and reference white Color gamma and gray scale Viewing angle Gamma Image formation time Sample - and hold-ratio Frame rate Spatial resolution Screen/Pixel density 1/2

20 2. ISO Doc. Summary Part 5: Optical Laboratory test methods - VESA Metrology Committee member NIST Paul Boynton Project Leader - VESA FPDM Part 5 5. Measurement Conditions 5.1 Preparation Procedures 5.2 Test Accessories 5.3 Test Patterns 5.4 Alignment 5.5 Measurement Field 5.6 Meter Angular Aperture 5.7 Meter Time Response 5.8 Spectral Characteristics 5.9 Operating conditions of the device under test 5.10 Test illumination 6. Measurement Methods Basic Measurement Method : M Compound Measurement Procedure : P 2/2

슬라이드 제목 없음

슬라이드 제목 없음 I. Delft Meeting 2005 년 12 월 16 일 보고자삼성 SDI 위성백 PDP 관련 IEC 규격제정현황 61988-1 61988-2 61988-3 61988-4 발행완료 진행중 Area Terminology & Letter symbols Measuring methods Sectional specification Reliability Blank