슬라이드 제목 없음

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1 I. Delft Meeting 2005 년 12 월 16 일 보고자삼성 SDI 위성백

2 PDP 관련 IEC 규격제정현황 발행완료 진행중 Area Terminology & Letter symbols Measuring methods Sectional specification Reliability Blank detail specifications Essential ratings & Characteristics Panel & Modul e IEC /Ed. 1.0 Terminology and letter symbols Publication MRD : 2008 IEC / Ed. 1.0 Measuring methods - Optical Publicat ion MRD : 2007 IEC / Ed. 1.0 Measuring methods - Optoelectrical Publication MRD : 2007 IEC / Ed. 1.0 Measuring methods - Quality 110/52/CD P L : Yan- 중국 IEC /Ed.1.0 Mechanical interface 110/XX/FDIS PL : Tolner- 네덜란드 IEC / Ed.1.0 Electrical interface 110/23/ NP-Approved PL : Park- 한국 IEC / Ed. 1.0 Environmental and mechanical endurance test methods 110 / 24/ CD PL : We 한국 IEC / Ed. 1.0 PL : Ando 일본 Generic specification 110/23/NP -Approved

3 1. 개요 일시 : 2005 년 9 월 24 일 ~ 26 일 장소 : Hotel Campanile, Delft, Netherlands 참가자 : 6 개국 (14 명 ) 1 명 한국 3 명, 일본 6 명, 중국 2 명, 프랑스 1 명, 네덜란드 1 명, 미국 - 한국측참가자박세광교수 ( 경북대 ) 위성백대리 ( 삼성 SDI) 박경원대리 ( 삼성 SDI)

4 2. 회의안건 1. Opening of the meeting 2. Confirmation of the agenda 3. Discussion of PDP standards -Part 2-3 Measuring methods(quality) - 1CD draft P/ L : Dr. Xiaolin Yan (TCL) -Part 4 Environmental and mechanical endurance test methods CDV circulation P/ L : 위성백 ( 삼성 SDI) -Part 5 Generic specification CD draft P/ L : Mr. T. Ando (Matsushita) 4. Other business 5. Date and place of the next meeting

5 Part 2-3 Measuring methods- Quality (1) a) Illuminance on the panel AS IS Vertical-plane illuminance 100lx Horizontal-plane illuminance 70lx [ US Comment ] TO BE It would be worthwhile to add how the illuminance should be measured. An illuminance meter with a hemispherical cosine correction attatchment can be used to measure the illuminance. Dr. Larry Weber 가준비해서 Next meeting 에서협의하기로함.

6 (2) Specification of cell defects 서술형으로나열된 Cell defect 에대한정의를이해하 기가 어려운점을고려하여 Figure 를추가하기로함. Pioneer Mr. Uchidoi homework For example,

7 (3) Measuring procedure AS IS Input one of a full screen black, white, red, green and blue signals to the module. Each signal is described in table 1. Observe cell defects and classify them to three types of cell defects. Record the number of three type cell defects. Observation area on the screen may be divided into two zones as shown in figure 3. An input signal is changed to another signal after the observation of the cell defects of one signal is completed. After the measurement of all input signals, record the total number of the defects and finish the measurement. TO BE Applied input signals are full black, full white, full red, full green, and full blue. When different screen condition(s) are applied, they shall be reported. Observed defect type on each screen are as follows; dark defect, bright defect and unstable cell on full white screen, bright defect and unstable cell on full black screen, bright defect, red dark defect and unstable cell on full red screen, bright defect, green dark defect and unstable cell on full green screen, and bright defect, blue dark defect and unstable cell on full blue screen. Applied signal conditions and observed defect types are summarized in table 1.

8 (4) 5.3 Luminance lifetime Example 로사용된 Figure 를볼때 PDP lifetime curve 가 1 차 함수로표현됨 Real data 를고려한 Curve 로수정요청

9 Part 4 Environmental and mechanical endurance test methods Japanese member 의요청으로 Project Title 변경협의 [ Japanese member s comment ] The present title is confusing. Environmental and endurance are mixed up. Endurance 의미와표준내용상의 mismatching 의이유로변경요청 Endurance 를삭제하고환경, 기구내구성으로 title 을변경하기로하되차기미팅에서재협의하기로함 [ 변경案 ] IEC Environmental and mecanical test methods

10 Part 5 Generic specification AQL sampling plans 협의 (1) Sampling define How large sample size is necessary to asses the quality level of a lot? Specify LOT N SAMPLE n Number of defective Quality level (failure rate) Inspection level Lot size Failure Rate = p Minimum sample number n Acceptance number c

11 (2) Related standards AQL sampling plan MIL-STD-105 ISO 2859 Sampling plans and procedures for inspection by attributes ISO Part 0: Introduction to the ISO 2859 attribute sampling system ISO Part 1: Sampling plans indexed by acceptable quality level (AQL) for lot-by-lot inspection ISO Part 2: Sampling plans indexed by limiting quality (LQ) for isolated lot inspection ISO Part 3: Skip-lot sampling procedures JIS Z 9015 (Japan) IEC Sampling procedures for inspection by attributes LTPD sampling plan MIL-STD no succession Both systems are widely used for semiconductor components.

12 (3) Compare AQL and LTPD sampling plan AQL (Acceptance Quality Limit) Acceptance probability α n = 100 c = 8 Lot of failure rate AQL=5% cannot pass at probability α = Producer s Risk AQL sampling plan means: The sampling plan that set n and c to make α 5% for given AQL value β LTPD (Lot Tolerance Percent Defective) Lot failure rate p AQL LTPD Lot of failure rate LTPD=13% passes at possibility β = Customer s Risk OC curve: determined by sample number n and acceptance number c LTPD sampling plan means: The sampling plan that set n and c to make β 10% for given LTPD value

13 Others IDC Report Review by Dr. Larry Weber 고 음. End User 가오해하고있는대형디스플레이, 특히 PDP 관련하여시장에유통되 있는타대형디스플레이와의평가를통해올바른정보를공유하고자하였

14 [ Test Results ] (1) Image Retention 동일한고정화면을장시간 display할경우 PDP가취약하지만 End User의일반적인동영상시청조건에서는차이없음. (2) Accelerated Aging : 4주동영상인가후측정결과 초기휘도대비 초기휘도대비 초기휘도대비

15 (3) Black Level (4) Viewing Angle

16 (5) White and color brightness uniformity 제 6 회평판디스플레이표준화기반구축사업워크샵

17 (6) Direct viewing color accuracy 제 6 회평판디스플레이표준화기반구축사업워크샵

18 Moving Image Resolution by Pioneer PDP 가 PANEL 자체의 Resolution 은 LCD 대비떨어지지만실질적인동영상조건에서평가 한결과 PDP 가오히려우수하다는평가결과

19 Next meeting IDW 05 - Date : 12/4 ~ 12/6 - Place : Takamatsu, JAPAN

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02 1 1 22 36 38 46 5 1 54 61 65 77 81 2 _ 3 4 _ 5 6 _7 8 _ 9 1 0 _ 11 1 2 _ 13 1 4 _ 15 1 6 _ 17 1 8 _ 19 2 0 _ 21 2 2 www.kats.go.kr www.kats.go.kr _ 23 Scope of TC/223 Societal security International