ISSN (Print) / ISSN (Online) The Transactions of the Korean Institute of Electrical Engineers Vol. 63, No. 4, pp. 490~494, 2014 http
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1 ISSN (Print) / ISSN (Online) The Transactions of the Korean Institute of Electrical Engineers Vol. 63, No. 4, pp. 490~494, 고속전원차단회로설계제작및측정 A Design of High-speed Power-off Circuit and Analysis 정상훈 * 이남호 ** 조성익 (Sang-hun Jeong Nam-ho Lee Seong-ik Cho) Abstract - In this paper, a design of high-speed power-off circuit and analysis. The incidence of high-dose transient radiation into the silicon-based semiconductor element induces the photocurrent due to the creation of electron-hole pairs, which causes the upset phenomenon of active elements or triggers the parasitic thyristor in the element, resulting in latch-up. High speed power-off circuit was designed to prevent burn-out of electronic device caused by Latch-up. The proposed high speed power-off circuit was configured with the darlington transistor and photocoupler so that the power was interrupted and recovered without the need for an additional circuit, in order to improve the existing problem of SCR off when using the thyristor. The discharge speed of the high speed power interruption circuit was measured to be 19 μs with 10 μf and 500 Ω load, which was 98% shorter than before (12.8 ms ). Key Words : Power-off, Latch-up, Transient Radiation Effects (TRE) 1. 서론높은선량의펄스방사선이 CMOS 소자에입사되면 E/H Pair 생성으로인한광전류가유기되고유기된광전류는 Upset 현상또는소자내의기생사이리스터를트리거시켜 Latch-up을발생시킨다 [1-2]. Latch-up 현상이지속되면전자소자에 Burn-out 현상이발생하게되어망가진다. 펄스방사선으로인한전자소자의 Latch-up을방지하기위해서는전원과전자회로사이에전원차단회로를부착하고펄스방사선검출신호 [3] 를이용하여전자소자의전원을차단하고잔류전원을방전시켜야 Latch-up 현상이사라지게된다. 기존의전원차단회로는전자소자에병렬로사이리스터를연결하고펄스방사선검출신호를이용하여사이리스터를트리거시켜전자소자로공급되는전원을우회하였다. 공급되는전원이사이리스터를통해대부분흐르므로전자소자에전원공급이안되고 Latch-up 현상을유지할수없다.[4] 단사이리스터는한번트리거되면 off 시키기위해서는역전압을인가하거나전원을완전히차단해야하므로전원을차단하기위한추가적인작업이필요하다. 따라서실시간으로동작해야하는시스템의적용에는불리하다. 본논문에서는기존의전원차단회로를개선하여고속으로전원을차단하고잔류전원을방전하여전자소자의 Latch-up을방지할수있는전원차단회로를설계하고기존 Corresponding Author : Dept. of Electronic Engineering, Chonbuk National University, Korea shcho@jbnu.ac.kr * Dept. of Nuclear Convergence Technology Development Korea Atomic Energy Research Institute, Korea ** Dept. of Nuclear Convergence Technology Development Korea Atomic Energy Research Institute, Korea Received : September 12, 2013; Accepted : March 10, 2014 의전원차단회로의동작문제를개선하여입력신호에의해전원차단회로가 off 될수있도록설계하고설계된회로를제작하여고속방전기능을검증하고자한다. 본논문의구성은다음과같다. Ⅱ장에서는제안하는전원차단회로의설계및모의실험결과를설명하고 Ⅲ장에서는 Ⅱ장에서설계한고속전원차단회로를제작하여실측하였다. 그리고 Ⅳ장에서결론을맺는다. 2. 고속전원차단회로기존의전원차단회로는펄스방사선검출신호를이용하여전자소자를보호할수있지만전원차단회로를 off 시키기위해서역전압을인가하거나전원을완전히차단해야하므로전자소자를재동작하기위해서는많은절차가필요하다이러한절차를간소화시키고고속으로동작할수있는전원차단회로를설계하고자한다. 2.1 기존구조의전원차단회로기존구조의전원차단회로는다이오드, 인덕터, 커패시터, BJT, 사이리스터로구성이되어있으며그림 1에회로도를보여준다. PWR_IN은전원공급회로에서전원을공급받는단자이며 LOAD는전자소자와연결되어전원을공급하는단자이다. TRD는펄스방사선검출기의출력을받는단자이며 TRD 입력이 High일경우사이리스터의게이트에 Low 전압이인가되어 PWR_IN을통해입력된전하들이 LOAD로출력된다. TRD 입력이 Low일경우사이리스터의게이트에 High 전압이인가되어 PWR_IN을통해입력된전하들이사이리스터를통해빠져나감으로 LOAD는정상상태의전압을유지할수없다. TRD에 High 신호가입력되는경우 Q2의베이스전압또한 High가되므로 Q2가동작하지않아컬렉터전압이 490
2 Trans. KIEE. Vol. 63, No. 4, APR, 2014 Low가된다. 컬렉터전압이 Low가되면사이리스터의게이트는동작하지않으므로 PWR_IN을통해입력된전원이그대로 Load로전달되어전자시스템에전원을공급한다. TRD에 Low 신호가입력되는경우 Q2의베이스에 Low 전압이인가되고 Q2의컬렉터에 High 전압이걸리게된다. 따라서사이리스터의게이트에 High가인가되므로사이리스터가트리거되어전원공급회로에서 PWR_IN을통해공급되는전하를 GND로방출시켜 LOAD단전압을낮춘다. LOAD단전압이낮아지면전자소자는 Latch-up 상태를유지할수없어번아웃을방지할수있다. 전자소자를다시동작시키기위해서는전원차단회로의동작을 Off 시켜야하며전원차단회로내사이리스터를정지시키기위해서는역전압을인가하거나전원을완전히차단해야하므로추가회로가필요하고초기상태로복구되는시간이증가한다. 그림 1 기존구조의전원차단회로 Fig. 1 Conventional structure of the power-off circuit 2.2 제안하는구조의전원차단회로기존의전원차단회로에사용된사이리스터는트리거될경우동작상태를유지하며사이리스터를 off 시키기위해서는애노드와캐소드사이의전압을 0V로만들어주거나전류를역방향으로흘려주어야한다. 따라서전원차단회로내사이리스터를 off 시키기위해공급되는전원을완전히차단후인가하여야전원차단회로가초기화되므로실시간으로사용되는전자시스템에는적용하기힘들다. 전자시스템의전원을실시간으로차단하고복구시키기위해달링턴트랜지스터를적용하여전원차단회로를개선하였다. 달링턴트랜지스터는 DC 이득이매우크고출력이 Base 입력에의존적으로과도방사선검출기출력에따라추가회로없이전자시스템의전원을차단하고다시공급할수있다. 제안하는전원차단회로는 ±20V, 5V의전원에서동작하고달링턴트랜지스터, BJT, 저항, 포토커플러로구성되어있다. 설계는 TRD 신호가 High(5 V) 일때입력전원을그대로출력하고 TRD 신호가 Low 일때 (0 V) 입력전원을차단하고잔류전하를방전시킬수있도록설계하였으며동작원리는다음과같다. 그림 2의 TRD에 High 신호가인가되면포토커플러가동작하고달링턴트랜지스터가 On이되므로입력전원을그대로출력단으로전달하고 TRD에 Low 신호가인가되면포토커플러가동작하지않아달링턴트랜지스터가 Off되고방 전회로가동작하여 POUT 전압이 GND로수렴하게된다. 이때 TRD 신호가 High가되면달링턴트랜지스터 Q9가정상적으로 On이되고 Q10이 Off되므로 POUT에정상적으로전하를공급할수있다. 그림 2에제안하는구조의전원차단회로의회로도를보여주며상세한동작은다음과같다. 제안하는고속전원차단회로의정상동작시에는 PIN+ 와 PIN-에는각각 ±20 V의전원이공급되고 5 Vdc에는 +5 V 전원이공급된다. TRD 단자에 5V가인가되면 Q3는 Off 상태에있고 Q5의베이스전압이 0V가되므로 Q5도 Off 되어포토커플러의입력에 5 V가인가되어포토커플러가 On 이된다. 포토커플러 HMA121이 On이되면 Q2의베이스전압이낮아지므로 Q2가동작하고 Q4의베이스전압이상승한다. Q4는 Off 상태가되고저항 R6에의해 Q9의베이스전압이낮아지므로 Q9가 On이되어 POUT+ 에 +20 V를공급한다. Q8은 On이되므로 Q10의베이스가 High가되어 Q10은 Off된다. -20 V 또한 +20 V와반대의동작으로 Pout-에 20 V를공급한다. TRD 단자에 0 V가인가되면 Q3의베이스전압이 0 V가되어 Q3이 On이된다. Q3이 On이되면 Q5의베이스전압이 High가되고 Q5의컬렉터전압이 Low가되어포토커플러가 Off된다. 포토커플러가 Off되면 Q2의베이스에 20 V가인가되어 Q2가 Off된다. Q2가 Off되면 Q4의베이스전압이 Low가되어 Q4가동작하고 Q9의베이스에 High 가인가되어 Q9가 Off된다. Q9가 Off되면전원전송경로가차단되므로 POUT+ 에 +20 V가인가되지못한다. Q9의베이스전압이 High가되면 Q8의베이스전압또한 High가되므로 Q9 이 Off되고 Q10의베이스전압이 Low가되어 Q10이동작한다. Q10이동작하면 POUT+ 과 GND가연결되어 POUT+ 에남아있던잔류전원들이 GND로방전된다. Latch-up이유지되기위해서는전원이계속하여공급되어야한다. 고속전원차단회로는전자시스템의전원을차단하고잔류전원을방전하므로전자시스템의 Lacth-up으로인한 Burn-out을방지할수있다. 그림 2 제안하는구조의전원차단회로 Fig. 2 Proposed structure of the power-off circuit 2.3 제안하는전원차단회로모의실험그림 3은제안하는구조의전원차단회로모의실험결과를보여준다. TRD 입력이 5 V일때에는전원차단회로출력이 고속전원차단회로설계제작및측정 491
3 전기학회논문지 63 권 4 호 2014 년 4 월 ±20 V를유지한다. 하지만 TRD 입력이 0 V로변하는경우전원이차단되고잔류전원을방전시켜출력전압이 0 V로변하는것을볼수있다. 기존구조의경우사이리스터를오프시키기위해추가회로를필요로하였지만제안하는구조에서는추가회로없이입력신호에따라전원차단및복귀가가능하다. 제안하는구조의전원차단회로방전기능을확인하기위해모의실험을진행하였다. 그림 4는 10 μf, 500 Ω의부하에서방전속도를모의실험한결과이다. 그림 4의 (a) 는고속전원차단회로가없을때방전시간을측정한것으로전압이 20 V에서 2 V 까지감소하는데 12.4 ms의시간이걸렸으며고속전원차단회로적용후에는 27 μs가걸리는것을모의실험을통해확인하였다. (a) 전원차단회로적용전 (a) Before applying the power-off circuit 그림 3 제안하는구조의전원차단회로모의실험 Fig. 3 Simulation result of the proposed power-off circuit 3. 제안하는전원차단회로제작및전기적특성제안하는전원차단회로의검증을위해전원차단회로를제작하고전기적특성을측정하였다. 그림 5는제안하는전원차단회로를구현한것으로칩저항, BJT, 포토커플러, 달링턴 BJT를이용하여제작하였다.. 면적은 25 mm 30mm로소형으로설계하였다. 그림 6은고속전원차단회로의실측결과를보여준다. 부하는모의실험과마찬가지로 10 μf의커패시터와 500 Ω의저항을사용하였다. 그림 6(a) 는고속전원차단회로를적용하지않은측정결과이며모의실험결과와마찬가지로출력전압이 2 V까지감소하는데 12.8 ms가걸리는것을확인하였다. 그림 6(b) 는고속전원차단회로를적용한측정결과이며모의실험결과와비슷하게 2 V까지감소하는시간이 19 μs가걸리는것을확인하여기존 12.8 ms에비해방전시간이 98% 정도단축됨을보인다. 표 1에전원차단회로의모의실험결과와실측결과를정리하였다. (b) 전원차단회로적용후 (b) After applying the power-off circuit 그림 4 제안하는구조의전원차단회로방전기능모의실험 Fig. 4 Simulation result of the discharge function with proposed power-off circuit 3. 결론본논문에서는고선량의펄스방사선에의해전자소자에서발생하는 Latch-up을방지하기위한고속전원차단회로를설계하고제작하였다. 기존전원차단회로동작시전자회로를재동작하기위해서는전원차단회로가 off되어야하나사이리스터를사용한전원차단회로에서는역전압을인가하거나공 그림 5 제안하는구조의전원차단회로 DUT Fig. 5 Proposed power-off circuit DUT 급되는전원을완전히차단시켜야한다. 문제를해결하기위해사이리스터가사용된구조대신달링턴트랜지스터를이용하였고또한입력신호에따라전원을고속으로차단및방전하고복구시킬수있도록회로를 492
4 Trans. KIEE. Vol. 63, No. 4, APR, 2014 감사의글 본연구는국방과학연구소의민군기술협력센터의지원으로수행되었음 References (a) 전원차단회로적용전 (a) Before applying the power-off circuit (b) 전원차단회로적용후 (b) After applying the power-off circuit 그림 6 제안하는구조의전원차단회로방전기능측정 Fig. 표 6 Test result of the discharge function with proposed power-off circuit 1 고속전원차단회로특성 Table 1 Characteristics of high-speed power-off circuit 방전속도모의실험측정 고속전원차단회로적용전 고속전원차단회로적용후 12.4 ms 12.8 ms 27 μs 19 μs [1] George C Messenger, "The effects of radiation on electronic systems", New York : Van Nostrand Reinhold, cop., [2] Lewis Cohn, Manfred Espig, Al Wolicki, Mayrant Simons, Clay Rogers, Alfred Costantine, "Transient Radiation Effects on Electronics(TREE) Handbook", Defence Nuclear Agency, [3] Larry L., "NUCLEAR EVENT DETECTOR", pp. 2, Aug [4] Douglas G., "SOLID STATE CROWBAR CIRCUIT", pp. 2, Mar [5] Seungchan Oh, Namho Lee, Heungho Lee, The Study of Transient Radiation Effects on Commercial Electronic Devices Thh Transactions of the Korean Institute of Electrical Engineers, V.61, no.10, 2012, pp [6] Namho Lee, Younggwan Hwang, Jongryul Kim, Sanghun Jeong, Seungchan Oh, A Study on Implementation of Transient Radiation Effects on Electronics(TREE) Assessment System Journal of the Korea Institute of Information and Communication Engineering, V.16 no.10, 2012, pp 저자소개 구성하였다. 전원차단회로는 Power BJT, BJT, 저항, 포토커플러로구성되어있으며펄스방사선검출기에서펄스방사선을감지하고출력하면이를입력으로받아전자소자의전원공급을차단하고고속으로방전하여 Latch-up을방지한다. 전원차단회로제작후측정결과부하 10uF, 500Ω의저항에서입력신호인가후 20V에서 1V까지감소시간이 19us가걸리는것을확인하였으며고속방전회로없이측정한 12.8ms에비해 98% 단축되었다. 본논문에서제작된전원차단회로를전자회로에적용한다면 Latch-up 현상으로인한전자소자의 Burn-out 현상을방지할수있을것이다. 정상훈 ( 丁相勳 ) 2007년전북대학교반도체과학기술학과학사졸업, 2009년전북대학교전자정보공학부석사졸업, 2014년동대학원박사졸업, 현재 : 한국원자력연구원융합기술개발부박사후연구원주관심분야 : Transient Radiation Modeling, 고속방전회로, 펄스신호고속신호처리 shjeong@kaeri.re.kr 고속전원차단회로설계제작및측정 493
5 전기학회논문지 63 권 4 호 2014 년 4 월 이남호 ( 李南昊 ) 1991년경북대학교전자공학과학사졸업, 1993년경북대학교전자공학과석사졸업, 2004년충남대학교전기공학과박사졸업, 현재 : 한국원자력연구원융합기술개발부책임연구원주관심분야 : 방사선센서, 입체영상, 원격제어시스템 조성익 ( 趙成翊 ) 1987년전북대학교전기공학과학사졸업, 1989년전북대학교전기공학과석사졸업, 1994년전북대학교전기공학과박사졸업, 1996년~2004년 Hynix 반도체메모리연구소책임연구원, 2004년~현재전북대학교전자공학부부교수주관심분야 : 저전압 / 고속 Graphic DRAM, Low-voltage Low-power analog circuit, High speed data Interface circuit, ADC/DAC, Filter, PLL/DLL sicho@jbnu.ac.kr 494
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